Muzaki MA, Subiyanto S, Anantyo A. Insulator Defect Detection Based On Image Processing Using A Modified YOLOv8n Model. J. Tek. Inform. (JUTIF) [Internet]. 2026 Feb. 15 [cited 2026 Mar. 8];7(1):60-8. Available from: https://jutif.if.unsoed.ac.id/index.php/jurnal/article/view/4679